技術情報 | DCGシステムズ

DCGシステムズはテクノロジーの最先端を更に押し進めるべく努力を続ける優秀な科学者と技術者の集団です。
この技術情報ではDCGによる最先端の解析技法の紹介をしています。DCG製品に実用化されている最新解析技術と方法の詳細な情報はこちらでご確認ください。

US Patent	Other Patent	Title
Pending (Filing date: May 17, 2006)		A system for probing a DUT comprising a tunable or CW laser source, and a modulator for modulating the output of the laser source.
Pending (Filing date: Sep 30, 2005)		Contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits
Pending (Filing date: Feb 10, 2005)		Hard-docking of a tester head to a DUT, while permitting the angular alignment of a specimen to be inspected to the optical axis of an optical testing tool
Pending (Filing date: May 8, 2007)		Probe-less non-invasive detection of electrical signals from integrated circuit devices
Pending (Filing date: Sep 21, 2004)		Image to image alignment using oversampled cross correlation
Pending (Filing date: Mar 2, 2005)		Discrimination between photons emitted by transistors and photons emitted by background sources

US Patent	Other Patent	Title
7,327,452 (February 5, 2008)		Light Beam Apparatus and Method for Orthogonal Alignment of Specimen
7,323,862 (January 29, 2008)		Contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits
7,314,767 (January 1, 2008)		Method for Local Wafer Thinning and Reinforcement